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В этом разделе представлена краткая, общая информация о сфере деятельности и/или полная производственная программа LEO Electron Microscopy. |
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| SEM Products- Conventional Scanning Electron Microscopes, Variable Pressure Scanning Electron Microscopes, Field Emission Scanning Electron Microscopes. The new LEO VPSE (variable pressure secondary electron) detector. TEM Products- Conventional Transmission Electron Microscopes, Energy Filter Transmission Electron Microscopes. The MICRON - High Resolution Imaging Plate Scanner for all Applications in Transmission Electron Microscopy. |
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